A new type of natural radiation experiment on FLASH memories will be presented at the 2013 IEEE International Reliability Physics Symposium (IRPS 2013), April 14-18, 2013, Monterey, CA, USA. The paper, entitled "Soft Errors Induced by Natural Radiation at Ground Level in Floating Gate Flash Memories", will be presented in the Soft-Error session (oral presentation).
The fourth RADSOL workshop, organized by the GDR CNRS ERRATA, will be held on June 14-15, 2011 at CNRS Paris, Campus Gérard Mégie
After the success of the first editions in 2008, 2009 and 2010, RADSOL 2011 will continue the series of informal workshops dedicated to the problematics of radiation effects at ground level in the natural terrestrial environment.
An invited talk will be given at the next 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, October 2010 11th - 15th, Monte Cassino Abbey and Gaeta - Italy.
This presentation is entitled:
Soft-Errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level
by Jean-Luc AUTRAN – Aix-Marseille University, IM2NP-CNRS (France).
The final paper will be published in a Special Issue of Microelectronics Reliability (Elsevier).
An invited talk will be given at the next International Conference on IC Design and Technology (ICICTD 2009) held in Austin, TX,May 18-20, 2009 about the ASTEP project. This presentation is entitled:
"Combined Altitude and Underground Real-Time SER Characterization of CMOS Technologies on the ASTEP-LSM Platform (invited)"
by J.L. Autran, P. Roche, S. Sauze, G. Gasiot, D. Munteanu, P. Loaiza, M. Zampaolo and J. Borel