The third RADSOL workshop (in French) will be held on June 3-4, 2010 at CNRS Paris, Campus Gérard Mégie.

After the success of the two first editions in 2008 and in 2009, RADSOL 2010 will continue the series of informal workshops dedicated to the problematics of radiation effects at ground level in the natural terrestrial environment.

An invited talk will be given at the next 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, October 2010 11th - 15th, Monte Cassino Abbey and Gaeta - Italy.

This presentation is entitled:

Soft-Errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level

by Jean-Luc AUTRAN – Aix-Marseille University, IM2NP-CNRS (France).

The final paper will be published in a Special Issue of Microelectronics Reliability (Elsevier).

An invited talk will be given at the next International Conference on IC Design and Technology (ICICTD 2009) held in Austin, TX,May 18-20, 2009 about the ASTEP project. This presentation is entitled:

"Combined Altitude and Underground Real-Time SER Characterization of CMOS Technologies on the ASTEP-LSM Platform (invited)"

by J.L. Autran, P. Roche, S. Sauze, G. Gasiot, D. Munteanu, P. Loaiza, M. Zampaolo and J. Borel

After the success of the first edition, RADSOL 2009 will be held in Paris in June 2009. This national workshop (in French) will address the growing influence of the radiative natural constraint on the reliability of electronic systems. This seminar is designed for payers, designers and systems integrators (motor transport, rail transport, computers, data processing) and offers a review of methods of evaluation and testing of the effects of natural radiation on the reliability of components and systems.