Altitude SEE Test European Platform

Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level

Jean-Luc Autran — 2010-08-23T12:36:15Z

This review covers our recent (2005–2010) experiments and modeling-simulation work dedicated to the evaluation of natural radiation-induced soft errors in advanced static memory (SRAM) technologies. The impact on the chip soft-error rate (SER) of both terrestrial neutrons induced by cosmic rays and alpha-particle emitters, generated from traces of radioactive contaminants in CMOS process or packaging materials, has been experimentally investigated by life (i.e. real-time) testing performed at ground level on the Altitude Single-event Effect Test European Platform (ASTEP) and underground at the underground laboratory of modane (LSM). The paper describes these two test platforms and surveys the characterization results obtained for two SRAM technology nodes (130 nm and 65 nm). Experimental results concerning the characterization of the natural radiation environment are also reported.

This ESREF 2010 Invited paper is now available for download from the Elsevier ScienceDirect website (corrected proofs) : click here

Alpha-Particle Induced Soft-Error Rate in CMOS 130nm SRAM

Jean-Luc Autran — 2010-08-23T08:55:00Z

We will report at RADECS 2010 the modeling and simulation of the soft-error rate (SER) in CMOS 130nm SRAM induced by alpha-particle emission in silicon due to uranium contamination at ppb concentration levels. Monte-Carlo simulation results have been confronted to experimental data obtained from long-duration (>20,000 h) real-time measurements performed at the under-ground laboratory of Modane (LSM) and from experimental counting characterization using an ultra low background alpha-particle gas proportional counter. The calibration of simulations with the measured SER allowed us to determine a 238U contamination level of 0.37 ppb (considered at secular equilibrium) in very good agreement with both corresponding alpha-particle emissivity levels measured and simulated at wafer-level in the range 1.1 to 2.3×10-3 alpha/cm2/h.

HOURLY DATA FOR JULY 2010

Sébastien Sauze — 2010-08-22T07:31:06Z

This is XLS Monthly file of Hourly Data for the month of July 2010.